Jetalon

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Jetalon Solutions Awarded Patent for Metal-ion Concentration Sensor Technology

Jetalon Solutions, Inc. a provider of next generation fluid metrology, today announced that it has been granted a new patent for its metal-ion concentration sensor technology by the U.S. Patent and Trademark Office.

Continuing the company’s commitment to bringing innovative products to manufacturers and processing facilities, U.S. patent 7,317,533 entitled “Metal ion concentration analysis for liquids” is the latest patent granted to Jetalon and was issued January 8, 2008. This patent discloses the use of Surface Plasmon Resonance to measure concentration of metal ions in liquids.

“Using this technology, Jetalon is able to create an in-situ concentration sensor that can be tuned to accurately measure specific metal ions in the sub-parts-per-million range,” said Dr. Ronald Chiarello, Jetalon’s President and CTO. “This product has a wide range of applications from process monitoring to wastewater and environmental regulatory compliance monitoring,” he added.

About Jetalon Solutions, Inc.
Jetalon produces unparalleled fluid metrology analysis systems for the most demanding manufacturing applications. Based on breakthrough technology, our miniaturized sensors offer extremely high resolution, complete process transparency and measurements in fractions of a second. Constructed of ultra-high purity materials with no moving parts, Jetalon’s sensors can be used with virtually any combination of chemicals and are easy to implement in manufacturing processes.

Founded in 2002, Jetalon Solutions, Inc. is headquartered in Pleasant Hill, CA. For more information, please visit www.jetalon.com or call Cristen Robinett at 925-274-1288.

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